This workflow aims to classify mixed types of defect in wafer maps.
This is a portable version, where the source dataset has already been converted to table.
Workflow
2023-Valtorta-Classificazione danni da operazioni di manipolazione
External resources
Used extensions & nodes
Created with KNIME Analytics Platform version 5.1.1
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KNIME AG, Zurich, Switzerland
Version 5.1.1
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KNIME AG, Zurich, Switzerland
Version 5.1.0
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University of Konstanz / KNIME
Version 1.8.3
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KNIME AG, Zurich, Switzerland
Version 5.1.0
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KNIME AG, Zurich, Switzerland
Version 5.1.0
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KNIME AG, Zurich, Switzerland
Version 5.1.0
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